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TLP傳輸線脈沖測試系統(tǒng)是一款便攜式脈沖IV-曲線特性表征系統(tǒng)，用于模擬靜電放電脈沖事件，例如TLP，vf-TLP，HMM，HBM，EFT和低壓浪涌。系統(tǒng)會檢測脈沖期間皮秒或納秒級的瞬態(tài)電壓和電流波形，并測試脈沖前、后被測器件的狀態(tài)（漏電流，擊穿電壓，偏置電流，靜態(tài)IV曲線等），可測的DUT包括靜電防護器件，半導(dǎo)體，電路模塊，觸摸板傳感器等。

ES631-線纜ESD放電測試系統(tǒng)是一種綜合型測試系統(tǒng)，用于模擬帶電的以太網(wǎng)線向任意基于以太網(wǎng)的網(wǎng)絡(luò)系統(tǒng)或設(shè)備放電時的影響。

TLP-1000 系列高壓脈沖發(fā)生器是我們推出的一款傳輸線脈沖（TLP）發(fā)生器，輸出電壓可達5 kV。該發(fā)生器能夠產(chǎn)生一個過沖小，平整度高的傳輸線脈沖，可直接注入被測器件（DUT），也可搭配不同的場探頭產(chǎn)生電場或磁場進行輻射場測試。發(fā)生器通過前面板上的5英寸觸摸屏或者后面板的串口進行電壓極性、電壓幅度以及輸出脈沖頻率的控制。發(fā)生器的脈沖寬度和上升沿可根據(jù)客戶需求進行定制化設(shè)計。

ES62X-LVS Low Voltage Surge System is designed for testing the surge immunity of devices at both wafer and package levels.

ES640 Charged Device Model (CDM) Test System$nCharged Device Model (CDM) electrostatic discharge is a common cause of microelectronic circuit failure.

ES622 Series TLP Pulsed IV-Curve System is an advanced IV-curve characterization system designed to simulate ESD events (TLP/ VF-TLP/ HMM/ HBM/MM pulse) and monitor a device

ES612A ESD TESTER (HBM, HMM, MM) is a 2-Pin tester designed for the evaluation of devices at both wafer level and package level. The tester is designed to carry HBM, HMM and MM ESD standards.

TLP-1000A Series Transmission Line Pulse Generator is our latest design for standalone TLP pulses that can generate and inject direct TLP pulses, E field and H field to the device under test